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Results 1 to 25 of 3768

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An experimental equatinn for dependence of duration of breaking arcs on supply voltage with constant circuit resistance : Recent Development of Electro-Mechanical DevicesSEKIKAWA, Junya; KUBONO, Takayoshi.IEICE transactions on electronics. 2005, Vol 88, Num 8, pp 1584-1589, issn 0916-8524, 6 p.Conference Paper

The ISL Rapid Fire Railgun Project RAFIRA-Part II: First ResultsSCHNEIDER, M; WOETZEL, M; WENNING, W et al.IEEE transactions on magnetics. 2009, Vol 45, Num 1, pp 448-452, issn 0018-9464, 5 p., 2Conference Paper

Novel preparation methods of electrical contacts in Ge-Sb-Te thin filmsMAHMOUD, Saleh T; GHAMLOUCHE, H; QAMHIEH, N et al.Applied surface science. 2007, Vol 253, Num 17, pp 7242-7245, issn 0169-4332, 4 p.Article

A Mortar Cell Method for Electro-Thermal Contact ProblemsALOTTO, P; GUARNIERI, M; MORO, F et al.IEEE transactions on magnetics. 2013, Vol 49, Num 2, pp 795-798, issn 0018-9464, 4 p., 2Conference Paper

A study of break-in film development with different piston ring coatings and correlation with electrical contact resistance measurementsTUNG, Simon C; HONG GAO.Lubrication engineering. 2003, Vol 59, Num 9, pp 20-25, issn 0024-7154, 6 p.Article

SCHOTTKY BARRIER HEIGHT VARIATION WITH METALLURGICAL REACTIONS IN ALUMINIUM-TITANIUM-GALLIUM ARSENIDE CONTACTSWADA Y; CHINO KI.1983; SOLID-STATE ELECTRONICS; ISSN 0038-1101; GBR; DA. 1983; VOL. 26; NO 6; PP. 559-564; BIBL. 13 REF.Article

THE CHARACTERISTICS OF AU-GE-BASED OHMIC CONTACTS TO N-GAAS INCLUDING THE EFFECTS OF AGINGMARLOW GS; DAS MB; TONGSON L et al.1983; SOLID-STATE ELECTRONICS; ISSN 0038-1101; GBR; DA. 1983; VOL. 26; NO 4; PP. 259-266; 7 P.; BIBL. 17 REF.Article

THE EFFECT OF BUILT-IN DRIFT FIELD AND EMITTER RECOMBINATIONS ON FCVD OF A P-N JUNCTION DIODEJAIN SC; RAY VC.1983; SOLID-STATE ELECTRONICS; ISSN 0038-1101; GBR; DA. 1983; VOL. 26; NO 6; PP. 515-523; BIBL. 18 REF.Article

EFFECT OF GETTERING ON LEAKAGE CURRENT IN SHALLOW JUNCTIONSGHEZZO M; GILDENBLAT G; COHEN SS et al.1983; APPLIED PHYSICS LETTERS; ISSN 0003-6951; USA; DA. 1983; VOL. 42; NO 6; PP. 519-521; BIBL. 3 REF.Article

RESISTANCE INCREASE IN SMALL-AREA SI-DOPED AL-N-SI CONTACTSMORI M.1983; IEEE TRANSACTIONS ON ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1983; VOL. 30; NO 2; PP. 81-86; BIBL. 13 REF.Article

Numerical Analyses for Contact Resistance due to Constriction Effect of Current Flowing through Multi-Spot ConstructionSAWADA, Shigeru; TAMAI, Terutaka; HATTORI, Yasuhiro et al.IEICE transactions on electronics. 2010, Vol 93, Num 6, pp 905-911, issn 0916-8524, 7 p.Article

Optical observation of arc discharges between electrical contacts breaking at low speed in DC42 V resistive circuit : Special section on recent development of electromechanical devices (selected papers from IS-EMD2005)SEKIKAWA, Junya; KUBONO, Takayoshi.IEICE transactions on electronics. 2006, Vol 89, Num 8, pp 1147-1152, issn 0916-8524, 6 p.Article

SCHOTTKY BARRIER MEASUREMENTS ON P-TYPE IN0,53)GA0,47)ASVETERAN JL; MULLIN DP; ELDER DI et al.1982; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1982; VOL. 97; NO 2; PP. 187-190; BIBL. 9 REF.Article

Tribological problems on electrical contactsMYSHKIN, N. K.Tribology international. 1991, Vol 24, Num 1, pp 45-49, issn 0301-679XArticle

Make and break properties of electrodepositsGROSSMANN, H; HUCK, M; SCHAUDT, G et al.IEEE transactions on components, hybrids, and manufacturing technology. 1985, Vol 8, Num 1, pp 70-79, issn 0148-6411Article

Overview of stamped electronic contactsSEIDLER, J.Electri.onics. 1985, Vol 31, Num 12, pp 55-57, issn 0745-4309Article

MICROSCOPIC INVESTIGATIONS OF SEMICONDUCTOR INTERFACESMARGARITONDO G.1983; SOLID-STATE ELECTRONICS; ISSN 0038-1101; GBR; DA. 1983; VOL. 26; NO 6; PP. 499-513; BIBL. 84 REF.Article

Electric contacts, Paris, 1988, June 20-24International conference on electric contacts. 14. 1988, VI-448 pConference Proceedings

Determination of potential at the beveled interface between two materialsLE HELLEY, M; CHANTE, J. P.Solid-state electronics. 1984, Vol 27, Num 12, pp 1123-1125, issn 0038-1101Article

AN ACCURATE SCALAR POTENTIAL FINITE ELEMENT METHOD FOR LINEAR, TWO-DIMENSIONAL MAGNETOSTATICS PROBLEMSMCDANIEL TW; FERNANDEZ RB; ROOT RR et al.1983; INTERNATIONAL JOURNAL FOR NUMERICAL METHODS IN ENGINEERING; ISSN 0029-5981; GBR; DA. 1983; VOL. 19; NO 5; PP. 725-737; BIBL. 10 REF.Article

Laser cladding of copper with molybdenum for wear resistance enhancement in electrical contactsNG, K. W; MAN, H. C; CHENG, F. T et al.Applied surface science. 2007, Vol 253, Num 14, pp 6236-6241, issn 0169-4332, 6 p.Article

Influence of Voltage on Arc Characteristics and Electrode Mass Change of AgNi Contacts for Electromagnetic Contactors : Recent Development of Electro-Mechanical evices - Papers selected from International Session on Electro-Mechanical Devices (IS-EMD2010) and other research resultsYOSHIDA, Kiyoshi; SAWA, Koichiro; SUZUKI, Kenji et al.IEICE transactions on electronics. 2011, Vol 94, Num 9, pp 1395-1401, issn 0916-8524, 7 p.Article

Dependence of motion of breaking arc on contact separating speed for Ag and Pd contact pairs in a DC42V resistive circuitNAKAMURA, Yoshinobu; SEKIKAWA, Junya; KUBONO, Takayoshi et al.IEICE transactions on electronics. 2007, Vol 90, Num 7, pp 1361-1368, issn 0916-8524, 8 p.Conference Paper

Effect of arcing behavior characteristics on welding resistance of relay contactsLI, Zhenbiao; WEI, Meifang; HASEGAWA, Makoto et al.IEICE transactions on electronics. 2007, Vol 90, Num 7, pp 1385-1390, issn 0916-8524, 6 p.Conference Paper

Theoretical and experimental analysis of electric contact surface hardening of ductile ironXIAOBEN QI; SHIGEN ZHU; HAO DING et al.Applied surface science. 2014, Vol 288, pp 591-598, issn 0169-4332, 8 p.Article

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